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Thursday, July 25
 

9:45am EDT

On-machine scanning with contact and non-contact sensors and how it can improve machining with closed loop metrology feedback Concord Convention Hall - A B C DChris Affer • Ray Karadayi

10:30am EDT

Improvement in the Use of Handheld Scanners Concord Convention Hall - A B C DJulio Sanchez

11:00am EDT

An Efficient Procedure for Reverse Engineering Parts and Assemblies in Vehicle Packaging to Improve Surface Reconstruction Accuracy Concord Convention Hall - A B C DAhmad Barari

11:30am EDT

On The “Edge” With Automated Applied Metrology Concord Convention Hall - A B C DJoseph DeFazio
 
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